HaiLa Technologies has introduced the EVAL2000 development board, featuring its BSC2000 passive backscatter Wi-Fi chip and ST’s STM32U0 MCU. The platform empowers developers and researchers to create ...

Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope. Neat! ==== Timeline ==== 0:00 Intro 0:27 How an SEM works 1:50 ...

Scrivener, K.L. (2004) Backscattered Electron Imaging of Cementitious Microstructures Understanding and Quantification. Cement and Concrete Composites, 26, 935-945.

Say hello to the toughest material on Earth Scientists have measured the highest toughness ever recorded, of any material, while investigating a metallic alloy made of chromium, cobalt, and nickel ...

Backscattered Electron and X-Ray (BEX) imaging is a method for Scanning Electron Microscopy (SEM) which obtains data from both X-Ray sensors, such as silicon drift detector, and Backscattered Electron ...

After being ejected, the electrons are immediately drawn back to the nanotip, and then backscatter off its surface. This imprints the electron pulse with information about the structure and dynamics ...

These images, generated from scanning electron microscopy, show the grain structures and crystal lattice orientations of (A) CrMnFeCoNi and (B) CrCoNi alloys. (C) and (D) show examples of ...

This article discusses and analyzes the quantification of differential potential developed due to the effect of secondary electron yield (SEY) and backscattered electron yield (BEY) at adjacent ...

A technique based on optical imaging has been used by an international research team to illuminate strains in lead halide perovskite solar cells without harming them. The scientists claim the ...