What is Electron Backscatter Diffraction (EBSD)? Electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction (BKD), is a powerful characterization technique used to analyze ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
Oxford Instruments’ Unity is a new detector for a groundbreaking new imaging technique in the Scanning Electron Microscope (SEM). It is the world's first Backscattered Electron and X-Ray (BEX) Imaging ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The SU8600 is a specialized imaging SEM ...
Sponsored by Gatan, Inc.Reviewed by Olivia FrostFeb 27 2025 Cipher ® maps the lithium distribution in a scanning electron microscope (SEM). Using a combination of quantified backscatter electron (qBSE ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback