Atomic Force Microscopy (AFM): A scanning probe technique that generates high-resolution images and measures mechanical properties by detecting forces between a sharp tip and the sample surface.

Polymer materials play an increasingly important role in a variety of industrial applications, thanks to their distinct physical and chemical properties. Among their key mechanical characteristics, ...

Kanazawa University, report in Small, on how short peptides self-assemble linearly on atomically-thick solid surfaces, such ...

Researchers reveal how hydration shapes peptide assembly on 2D materials, offering new insights for bioelectronics and ...

The researchers designed short and simple dipeptides, mainly consisting of alternating amino acids with aromatic side groups, tyrosine (Y) and histidine (H) (Fig. 2). The former is hydrophobic residue ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

Revealing hidden transformations in 2D materials with atomic force microscopes by Institute of Physics Zagreb edited by Sadie Harley, reviewed by Robert Egan Editors' notes ...

Atomic force microscopy (AFM) is coupled with time-domain two-dimensional infrared (2DIR) spectroscopy to develop AFM-2DIR nanospectroscopy, which combines the spatial precision of AFM with the ...

Based on the popular Agilent 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved ...