Abstract: Ridge detection is a classical tool to extract curvilinear features in image processing. As such, it has great promise in applications to material science problems; specifically, for trend ...

Abstract: Scanning electron microscopy (SEM) is a powerful imaging tool used to investigate the morphological capabilities of a variety of samples with a decision at the Nano scale. The electron ...

After 10 mini-speeches, the council’s only agenda item was to vote for mayor pro tem. It produced the only dicey moment at ...

In this interview, AZoMaterials speaks with Professor Sarah Haigh, Professor of Materials Characterization at the University of Manchester, about her pioneering work in electron microscopy and its ...