Transmission electron microscopes (TEMs) allow researchers at the forefront of energy technology to study next-generation ...

New research published in Joule from the Energy Storage Research Alliance (ESRA), University of Chicago Pritzker School of ...

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Cryogenic microscopy at Diamond Light Source enables high-resolution, correlative imaging of cells under near-physiological ...

Scientists have revealed how the body’s microscopic cold sensor, TRPM8, detects both chilly temperatures and the cooling ...

FTIR microscopy offers a strong method for detecting and characterizing contaminants, crucial for ensuring product safety and ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips ...

The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample surface using tapping mode feedback. This allows for stability during ...

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Key TakeawaysBerkeley Lab scientists developed a new way to determine atomic structures from nanocrystals previously ...