Abstract: Scanning electron microscopy (SEM) is a powerful imaging tool used to investigate the morphological capabilities of a variety of samples with a decision at the Nano scale. The electron ...
Abstract: In the rapidly evolving field of semiconductor manufacturing, the escalating complexity of integrated circuits poses significant challenges in identifying and analyzing defects, crucial for ...
Scanning electron microscopes (SEMs) facilitate significant scientific advancements by enabling researchers to investigate the properties of biological specimens and materials. However, traditional ...
The ability to precisely study and manipulate electrons in electron microscopes could open new possibilities for the development of both ultrafast imaging techniques and quantum technologies. Over the ...
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