Abstract: In recent decades, Scanning Acoustic Tomography (SAT) has become a vital technique for characterizing semiconductor devices in non-destructive evaluation. Precise and efficient segmentation ...
The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
Abstract: Based on the characteristic mode analysis (CMA), our earlier study (Fu et al., 2021) introduced a theoretical method for designing frequency-scanning antennas using coupled patch antenna ...
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