Large-scale microscopy combined with tissue clearing and expansion enables nanoscale imaging of centimeter scale specimens.

The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...

The Hitachi TM3000 Benchtop Scanning Electron Microscope (SEM) is easy to use compared to traditional SEMs and allows for observation of uncoated specimens in low vacuum mode. It can handle relatively ...

This is a Review of recent studies on surface structures of crystalline materials in the presence of gases in the mTorr to atmospheric pressure range, which brings surface science into a brand new ...

In this research study, a new multi-mode antenna element is introduced to achieve wide-angle scanning characteristics when integrated in a linear array. The unit cell structure relies on a hybrid ...