Abstract: In the rapidly evolving field of semiconductor manufacturing, the escalating complexity of integrated circuits poses significant challenges in identifying and analyzing defects, crucial for ...
The SU8600 represents Hitachi's latest Cold Field Emission SEM, integrating advanced imaging modes with three in-lens detectors and Energy Dispersive X-ray (EDX) detectors, achieving a lateral ...
Abstract: Dislocation is a major defect limiting the performance and lifetime of GaN devices. Investigating the microscopic structure of GaN dislocations at the atomic scale by transmission electron ...
The ability to precisely study and manipulate electrons in electron microscopes could open new possibilities for the development of both ultrafast imaging techniques and quantum technologies. Over the ...
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