Atomic Force Microscopy (AFM): A scanning probe technique that generates high-resolution images and measures mechanical properties by detecting forces between a sharp tip and the sample surface.

Invented in 1986 atomic force microscopy (AFM) has become a valuable tool for life scientists, offering the ability to image aqueous biological samples, like membranes, at nanometer resolution. The ...

Atomic force microscopy (AFM) is a standard imaging technique for the structural characterization of surfaces in different fields of materials science, surface science, and biology. Carbon nanotubes ...

Objective: To expand the use of AFM for biological applications and enhance the methods available to scientists in the Tri-Institution and greater New York City area. Asylum Research MFP-3D-BIO: ...

Fast, Multi-frequency and Quantitative Nanomechanical Mapping of Live Cells Using the Atomic Force Microscope. Alexander X. Cartagena-Rivera 1,2,†, Wen-Horng Wang 3, Robert L. Geahlen 3,4 and Arvind ...

Global manufacturers of atomic force microscopes - a Nanowerk Directory. Well over 20,000 AFM-related papers have been published; over 500 patents were issued related to various forms of scanning ...

Under atomic force microscopy (AFM), e.g., their surface can be rapidly scanned, and functional motions monitored, which is of great importance for applications in all fields of Life science.

Image Credit: Elizaveta Galitckaia/Shutterstock.com. What are AFMs? An AFM is an instrument used for mapping the atomic-scale topography of a surface by utilizing the repulsive electronic forces ...

Dec. 22, 2020 — Atomic force microscopy (AFM) allows to obtain images and movies showing proteins at work, however with limited resolution. The developed BioAFMviewer software opens the ...

Neurological disorders are becoming an increasingly significant societal burden, highlighting the critical need for improved ...

Walter B. McKenzie/ Photodisc/Getty Images A comprehensive review of the applications of AFM can be found in the book "Atomic Force Microscopy in Process Engineering", edited by Professors Richard ...