When Intel talks, people listen. So when Intel executive VP Dadi Perlmutter said in a keynote at ISSCC in 2012 that transient power noise was one of the most limiting aspects of the chip design ...
This application note discusses the DC and transient current capability and fuse characteristics of surface mount current sensor integrated circuits. It covers the testing performed and limitation of ...
The measurement of fast transient voltages is a relatively well-understood and documented procedure. However, the measurement of fast transient currents presents a number of measurement challenges ...
Semiconductor memory, card readers, microprocessors, disk drives, piezoelectric devices, and digital systems create transient loads that voltage regulators must service. Ideally, regulator output ...
Using a multiphase buck-converter topology for high-current, low-voltage automotive applications. Implementation of coupled inductors in the multiphase buck topology. Test results of a ...
Transient power is becoming much more problematic at 10/7nm, adding yet another level of complexity for design teams already wrestling with power issues caused by leakage, a variety of power ...
Damage from transient overvoltages is one of the leading causes of equipment failure. Although some pieces of equipment may come equipped with transient protection, others will need some form of ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results