Locard’s exchange principle, which states that “every contact leaves a trace” drives the concept of “trace evidence” in the forensic sciences. Trace evidence is usually classed as fine particles, ...
The Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) automates quality control procedures, providing accurate, reproducible results while freeing up time for more important ...
A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...
The interaction volume of a characteristic X-Ray emission can be seen in Figure 1. Typical EDS analysis in an SEM is carried out at relatively high energy (greater than 10 kV), which results in a vast ...
Unlock new insights with cathodoluminescence imaging in a benchtop SEM, enabling advanced material characterization.
Achieve high quality results with ease using tabletop SEM technology for efficient material analysis.
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