Scanning acoustic microscopy, or SAM, is a non-destructive technique used in failure analysis of complex devices. SAM can provide a resolution down to sub-micron thicknesses. SAM is an efficient tool ...

PVA TePla OKOS, a Virginia-based manufacturer of industrial ultrasonic non-destructive (NDT) systems, claims to have a solution based on scanning acoustic microscopy (SAM). A non-invasive and ...

Failure analysts often use scanning acoustic microscopes to image flip-chip features such as underfill voids, delaminations, and disbonded solder bumps. As designers have decreased the size of IC ...

PUNE, India, June 26, 2023 /PRNewswire/ -- According to a recent market study published by Growth Market Reports, titled, "Global Acoustic Microscope Market Segments - By Microscope (Scanning ...

A scanning probe microscope may be set to “contact mode” or “tapping mode.” Contact mode maintains a constant force between the cantilever tip of the microscope and the sample surface ...

For the best results with SAM systems, pay close attention to both the digitizer characteristics and the signal path.Automated inspection techniques are widely used in the semiconductor ...

Scanning acoustic microscopy started in the mid-1980s, but a system such as Sonoscan’s D-9000 adds speed, improves accuracy, and has software that uses wizards for easy setup and allows automation ...

The ICAM scanning acoustic microscope is a high speed, fully digital and integrated system designed for rapid non-destructive inspection of integrated circuit (IC) packages and similar parts. It can ...