Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...

For materials scientists, understanding the atomic structure of a material, revealing defects, or characterizing the chemical and physical processes that occur during the creation of material, are key ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

Discover how electron microscopy advances plant and microbial research with expert insights from the John Innes Centre’s ...

Unlock the potential of gas chromatography with innovative sample preparation techniques, including SPME, automation, and ...

Discover a new approach to SEM sample preparation that delivers high quality surfaces, and enables more accurate and reliable imaging results.