Electron microscopy is a powerful imaging technique that utilizes a beam of accelerated electrons to visualize and analyze the structure, composition, and properties of materials at the nanoscale.
This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results. Curious ...
A new specimen holder gives scientists more control over ultra-cold temperatures, enabling the study of how materials acquire ...
At many universities, student researchers rarely get the chance to even see a transmission electron microscope, or TEM, up ...