Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale investigation, enabling detailed imaging and quantification of surface topography as well as mechanical properties.

Anyone who has ever taken the time to critically examine a walnut knows that a two-dimensional photograph fails in many respects to truly convey the unique features--the nicks, crannies, valleys, and ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Researchers at Kanazawa University report in Nano Letters how high-speed atomic force microscopy leads to insights into processes relevant to Alzheimer's disease. Moreover, the technique is shown to ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

Macrophages drive key immune processes including inflammation, tissue repair, and tumorigenesis via distinct polarization ...

Over the last century, humans have experienced multiple severe viral outbreaks, including the Spanish flu and other influenza epidemics, HIV, SARS-CoV, MERS, Ebola, and the recent SARS-CoV2 pandemic.

Dublin, Aug. 27, 2025 (GLOBE NEWSWIRE) -- The "Atomic Force Microscopy Market by Offering (AFMs, Probes, Software), Grade (Industrial, Research), Application ...

Researchers developed and validated a label-free, non-invasive method combining AFM with deep learning for accurate profiling ...